As a key technology to study the physical mechanism of single event effects (SEEs) and to identify the sensitive area of microelectronic devices. heavy ion micro-beam irradiation has been paid more and more attention by researchers. Single ion hit (SIH) is an important part of heavy ion micro-beam irradiation. which could reduce the number of incident ions to just one through a series... https://www.roneverhart.com/NEXT-GENERATION-CORVETTE-LANYARD/